Research on Capacitance Voltage Transformer Harmonic Measurement

Research of Measurement Circuits for High Voltage Current Transformer Based on Rogowski Coils

The electronic current transformer plays an irreplaceable position in the field of relay protection and current measurement of the power system. Rogowski coils are used as sensor parts, and in order to improve the measurement accuracy and reliability, the circuits at the high voltage system are introduced and improved in this paper, including the analog integral element, the filtering circuit a...

Optical high voltage measurement transformer using white light interferometry

A new approach to perform measurement of potentials in high voltage levels using electrooptical Pockels sensors is presented here. This paper describes an application of the White Light Interferometry technique to a high voltage optical fiber measurement system. In this system the information is encoded in the spectrum of the light, allowing the measurement to be independent of the optical powe...

Coreless Transformer for Power Quality Measurement at Medium Voltage Level

Original scientific paper Measurement of grid voltage harmonic components is an important part of power quality measurements. Current high voltage transformers with iron core are not linear and cannot easily be used for accurate measurement of "polluted" voltages in wide frequency range. In this paper, design details of a new coreless voltage transformer for power quality measurement are given....

Measurement Error Estimation for Capacitive Voltage Transformer by Insulation Parameters

Measurement errors of a capacitive voltage transformer (CVT) are relevant to its equivalent parameters for which its capacitive divider contributes the most. In daily operation, dielectric aging, moisture, dielectric breakdown, etc., it will exert mixing effects on a capacitive divider’s insulation characteristics, leading to fluctuation in equivalent parameters which result in the measurement ...

Realization of a capacitance-voltage measurement system for semiconductor characterization